Research output per year
Research output per year
Search results
-
2019
Automated Profiling Method for Laser Fault Injection in FPGAs
Breier, J., He, W., Bhasin, S., Jap, D., Chef, S., Ong, H. G. & Gan, C. L., Jan 1 2019, Automated Methods in Cryptographic Fault Analysis. Springer International Publishing, p. 301-325 25 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
1 Citation (Scopus) -
2011
Voiding in copper interconnects during electromigration
Gan, C. L. & Lim, M. K., Aug 2011, Electromigration in Thin Films and Electronic Devices: Materials and Reliability. Elsevier Ltd, p. 113-134 22 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter
3 Citations (Scopus)