Keyphrases
Accelerated Aging Test
100%
Parameter Variation
100%
Transistor Parameters
100%
Insulated Gate Bipolar Transistors
100%
Temperature Stress
100%
Electrical Parameters
80%
Power Semiconductor Devices
60%
Power Cycling
60%
Pulse Width Modulation
60%
Modulation Power
60%
Passive Cycling
40%
Thermal Cycling
40%
Scanning Electron Microscopy Analysis
20%
Lifetime Estimation
20%
Parameter Search
20%
Active Power Cycling
20%
Threshold Voltage
20%
Gate Current
20%
System Load
20%
Temperature Cycling
20%
Load Profile
20%
Mechanistic Model
20%
Power Converter System
20%
On-state Voltage
20%
Accelerated Power Cycling Test
20%
Reliability Performance
20%
Gate Voltage
20%
Thermal Fatigue
20%
Estimation Model
20%
Accelerated Thermal Cycling Test
20%
Climatic Conditions
20%
Thermal Cycling Test
20%
Engineering
Comparative Analysis
100%
Bipolar Transistor
100%
Temperature Stress
100%
Parameter Variation
100%
Electrical Device
60%
Semiconductor Device
60%
Gate Voltage
40%
Failure Mechanism
40%
Climatic Condition
20%
Load Profile
20%
Heat Resistance
20%
Active Power
20%
Power Converter
20%
Material Science
Bipolar Transistor
100%
Thermal Cycling
100%
Microscopy
20%
Heat Resistance
20%