Direct imaging of the end-of-range and surface profiles of proton-beam written erbium-doped waveguide amplifiers by atomic force microscopy

T. C. Sum, A. A. Bettiol, J. A. Van Kan, S. Venugopal Rao, F. Watt, K. Liu, E. Y.B. Pun

Research output: Contribution to journal › Article › peer-review

11 Citations (Scopus)

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Physics

Material Science