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High-resolution channeling contrast microscopy of compositionally graded Si1-XGeX layers
H. L. Seng*, T. Osipowicz, T. C. Sum, M. B.H. Breese, F. Watt, E. S. Tok, J. Zhang
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
1
Citation
(Scopus)