Fingerprint
Dive into the research topics of 'Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors'. Together they form a unique fingerprint.- Sort by
- Weight
- Alphabetically
Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors
W. A. Sasangka, Y. Gao, C. L. Gan*, C. V. Thompson
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
3
Citations
(Scopus)