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Important sampling in high dimensions
S. K. Au
*
, J. L. Beck
*
Corresponding author for this work
Nanyang Technological University
California Institute of Technology Division of Engineering and Applied Science
Research output
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Article
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peer-review
345
Citations (Scopus)
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Keyphrases
Identity Matrix
40%
Static Reliability
40%
High-dimensional Reliability
40%
Engineering
Identity Matrix
100%