Integration of SALICIDE process for deep-submicron CMOS technology: Effect of nitrogen/argon-amorphized implant on SALICIDE formation

C. S. Ho*, K. L. Pey, H. Wong, R. P.G. Karunasiri, S. J. Chua, K. H. Lee, L. H. Chan

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

Fingerprint

Dive into the research topics of 'Integration of SALICIDE process for deep-submicron CMOS technology: Effect of nitrogen/argon-amorphized implant on SALICIDE formation'. Together they form a unique fingerprint.

Keyphrases

Material Science

Agricultural and Biological Sciences

Chemical Engineering

Earth and Planetary Sciences