Interdisciplinary characterization of sandwiched SiGe thin layers grown by molecular beam epitaxy

Keyphrases

• Molecular Beam Epitaxy 100%
• SiGe 100%
• Ion Channels 50%
• Comprehensive Characterization 50%
• Fourier Transform Infrared Spectroscopy (FT-IR) 50%
• X Ray Diffraction 50%
• Low Temperature 50%
• Photoluminescence 50%
• Heterostructure 50%
• Secondary Ion Mass Spectrometry 50%
• Raman Scattering 50%
• Si1-xGex 50%
• Rutherford Backscattering Spectrometry 50%

Physics

• Molecular Beam Epitaxy 100%
• Raman Spectra 50%
• Photoluminescence 50%
• X Ray Diffraction 50%
• Spectrometer 50%
• Backscattering 50%
• FTIR Spectroscopy 50%
• Spectroscopy 50%

Material Science

• Molecular Beam Epitaxy 100%
• X-Ray Diffraction 50%
• Photoluminescence 50%
• Heterojunction 50%
• Secondary Ion Mass Spectrometry 50%
• Fourier Transform Infrared Spectroscopy 50%
• Rutherford Backscattering Spectrometry 50%