Investigation of the role of pre-existing oxide in the initial degradation mechanism in AlGaN/GaN HEMTs under ON-state stress

H. T. Tan, Y. Gao, G. J. Syaranamual, W. A. Sasangka, S. C. Foo, K. H. Lee, S. Arulkumaran, G. I. Ng, C. V. Thompson, C. L. Gan^*

^*Corresponding author for this work