Mortality dependence of Cu dual damascene interconnects on adjacent segment

C. W. Chang*, C. L. Gan, C. V. Thompson, K. L. Pey, W. K. Choi, N. Hwang

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

1 Citation (Scopus)

Fingerprint

Dive into the research topics of 'Mortality dependence of Cu dual damascene interconnects on adjacent segment'. Together they form a unique fingerprint.

Keyphrases