Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations

Computer Science

• Design Tool 100%
• Computer Aided Design 100%
• Interconnect Tree 100%
• Integrated Circuit Layout 100%
• System Interconnect 50%
• Test Condition 50%
• Analytical Model 50%

Keyphrases

• Interconnect Metallization 100%
• Computer-aided Design Tools 100%
• Circuit Performance 50%
• Sampling Test 50%
• Thermal-aware 50%

Engineering

• Actual Circuit 20%
• Circuit Performance 20%