Residual stress in spark-plasma-sintered and hot-pressed tantalum samples determined by X-ray diffraction methods

P. Angerer*, W. Artner, E. Neubauer, L. G. Yu, K. A. Khor

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

14 Citations (Scopus)

Abstract

Tantalum samples have been compacted by the spark-plasma-sintering (SPS) sintering method. The sintering experiments have been conducted at temperatures between 1500 °C and 1900 °C and corresponding sintering times of 1 min each. The compacted samples of cylindrical shape have been characterized in respect of their residual stress by X-ray diffraction (sin2 ψ-method). The stress components in axial direction and in radial direction as occurring on the terminal circular faces of the samples have been determined. These results were compared with data obtained from conventional hot-pressed samples which were compacted between 1500 °C and 1700 °C for 60 min. In the lower temperature range below 1800 °C the stress parameters display no variation as a function of sintering method and sintering temperature. A dilatation parallel to the cylinder axis and a compression normal to the cylinder axis is observed. At 1900 °C significant changes are observed which coincides with structural and textural alterations in the samples.

Original languageEnglish
Pages (from-to)312-317
Number of pages6
JournalInternational Journal of Refractory Metals and Hard Materials
Volume26
Issue number4
DOIs
Publication statusPublished - Jul 2008
Externally publishedYes

ASJC Scopus Subject Areas

  • Ceramics and Composites
  • Mechanics of Materials
  • Mechanical Engineering
  • Metals and Alloys
  • Materials Chemistry

Keywords

  • Residual stress
  • Spark-plasma-sintering
  • Tantalum
  • X-ray diffraction

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