The role of tin oxide surface defects in determining nanonet FET response to humidity and photoexcitation

Cheng Sun, K. R.G. Karthik, Stevin S. Pramana, Lydia H. Wong, Jie Zhang, Huang Yizhong, Chorng Haur Sow, Nripan Mathews*, Subodh G. Mhaisalkar

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

25 Citations (Scopus)

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