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Thermal studies on stress-induced void-like defects in epitaxial-CoSi2 formation
C. S. Ho*, K. L. Pey, C. H. Tung, K. C. Tee, K. Prasad, D. Saigal, Jackie J.L. Tan, H. Wong, K. H. Lee, T. Osipowicz, S. J. Chua, R. P.G. Karunasiri
*Corresponding author for this work
Research output: Contribution to journal › Conference article › peer-review
2
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(Scopus)