Understanding the impact of surface engineering, structure, and design on electromigration through Monte Carlo simulation and in-situ SEM studies

Z. H. Gan*, W. Shao, M. Y. Yan, A. V. Vairagar, T. Zaporozhets, M. A. Meyer, A. Krishnamoorthy, K. N. Tu, A. Gusak, E. Zschech, S. G. Mhaisalkar

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Citations (Scopus)

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Engineering

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Material Science