TY - JOUR
T1 - A low-profile three-dimensional neural probe array using a silicon lead transfer structure
AU - Cheng, Ming Yuan
AU - Je, Minkyu
AU - Tan, Kwan Ling
AU - Tan, Ee Lim
AU - Lim, Ruiqi
AU - Yao, Lei
AU - Li, Peng
AU - Park, Woo Tae
AU - Phua, Eric Jian Rong
AU - Gan, Chee Lip
AU - Yu, Aibin
PY - 2013/9
Y1 - 2013/9
N2 - This paper presents a microassembly method for low-profile three-dimensional probe arrays for neural prosthesis and neuroscience applications. A silicon (Si) lead transfer structure, Si interposer, is employed to form electrical connections between two orthogonal planes - the two dimensional probes and the dummy application-specific integrated circuit (ASIC) chip. In order to hold the probe array and facilitate the alignment of probes during assembly, a Si platform is designed to have through-substrate slots for the insertion of probes and cavities for holding the Si interposers. The electrical interconnections between the probes and the dummy ASIC chip are formed by solder reflow, resulting in greatly improved throughput in the proposed assembly method. Moreover, since the backbone of the probe can be embedded inside the cavity of the Si platform, the profile of the probe array above the cortical surface can be controlled within 750 μm. This low-profile allows the probe array not to touch the skull after it is implanted on the brain. The impedance of the assembled probe is also measured and discussed.
AB - This paper presents a microassembly method for low-profile three-dimensional probe arrays for neural prosthesis and neuroscience applications. A silicon (Si) lead transfer structure, Si interposer, is employed to form electrical connections between two orthogonal planes - the two dimensional probes and the dummy application-specific integrated circuit (ASIC) chip. In order to hold the probe array and facilitate the alignment of probes during assembly, a Si platform is designed to have through-substrate slots for the insertion of probes and cavities for holding the Si interposers. The electrical interconnections between the probes and the dummy ASIC chip are formed by solder reflow, resulting in greatly improved throughput in the proposed assembly method. Moreover, since the backbone of the probe can be embedded inside the cavity of the Si platform, the profile of the probe array above the cortical surface can be controlled within 750 μm. This low-profile allows the probe array not to touch the skull after it is implanted on the brain. The impedance of the assembled probe is also measured and discussed.
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U2 - 10.1088/0960-1317/23/9/095013
DO - 10.1088/0960-1317/23/9/095013
M3 - Article
AN - SCOPUS:84884844502
SN - 0960-1317
VL - 23
JO - Journal of Micromechanics and Microengineering
JF - Journal of Micromechanics and Microengineering
IS - 9
M1 - 095013
ER -