A simple and direct method for interface characterization of OFETs

P. Srinivas; S. P. Tiwari; Harshil N. Raval; R. N. Ramesh; T. Cahyadi; S. G. Mhaisalkar; V. Ramgopal Rao

doi:10.1109/IPFA.2007.4378107

A simple and direct method for interface characterization of OFETs

P. Srinivas^*, S. P. Tiwari, Harshil N. Raval, R. N. Ramesh, T. Cahyadi, S. G. Mhaisalkar, V. Ramgopal Rao

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007
Pages	306-309
Number of pages	4
DOIs	https://doi.org/10.1109/IPFA.2007.4378107
Publication status	Published - 2007
Externally published	Yes
Event	2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits - Bangalore, India Duration: Jul 11 2007 → Jul 13 2007

Publication series

Name	Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

Conference

Conference	2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits
Country/Territory	India
City	Bangalore
Period	7/11/07 → 7/13/07

ASJC Scopus Subject Areas

General Engineering

Access to Document

10.1109/IPFA.2007.4378107

Cite this

Srinivas, P., Tiwari, S. P., Raval, H. N., Ramesh, R. N., Cahyadi, T., Mhaisalkar, S. G., & Rao, V. R. (2007). A simple and direct method for interface characterization of OFETs. In Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007 (pp. 306-309). Article 4378107 (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA). https://doi.org/10.1109/IPFA.2007.4378107

Srinivas, P. ; Tiwari, S. P. ; Raval, Harshil N. et al. / A simple and direct method for interface characterization of OFETs. Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007. 2007. pp. 306-309 (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

@inproceedings{dbe445cacbca42d78c5f328d90b82915,

title = "A simple and direct method for interface characterization of OFETs",

author = "P. Srinivas and Tiwari, {S. P.} and Raval, {Harshil N.} and Ramesh, {R. N.} and T. Cahyadi and Mhaisalkar, {S. G.} and Rao, {V. Ramgopal}",

year = "2007",

doi = "10.1109/IPFA.2007.4378107",

language = "English",

isbn = "1424410142",

series = "Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA",

pages = "306--309",

booktitle = "Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007",

note = "2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits ; Conference date: 11-07-2007 Through 13-07-2007",

}

Srinivas, P, Tiwari, SP, Raval, HN, Ramesh, RN, Cahyadi, T, Mhaisalkar, SG & Rao, VR 2007, A simple and direct method for interface characterization of OFETs. in Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007., 4378107, Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA, pp. 306-309, 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, Bangalore, India, 7/11/07. https://doi.org/10.1109/IPFA.2007.4378107

A simple and direct method for interface characterization of OFETs. / Srinivas, P.; Tiwari, S. P.; Raval, Harshil N. et al.
Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007. 2007. p. 306-309 4378107 (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - A simple and direct method for interface characterization of OFETs

AU - Srinivas, P.

AU - Tiwari, S. P.

AU - Raval, Harshil N.

AU - Ramesh, R. N.

AU - Cahyadi, T.

AU - Mhaisalkar, S. G.

AU - Rao, V. Ramgopal

PY - 2007

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U2 - 10.1109/IPFA.2007.4378107

DO - 10.1109/IPFA.2007.4378107

M3 - Conference contribution

AN - SCOPUS:39749136248

SN - 1424410142

SN - 9781424410149

T3 - Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA

SP - 306

EP - 309

BT - Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007

T2 - 2007 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits

Y2 - 11 July 2007 through 13 July 2007

ER -

Srinivas P, Tiwari SP, Raval HN, Ramesh RN, Cahyadi T, Mhaisalkar SG et al. A simple and direct method for interface characterization of OFETs. In Proceedings of the 14th International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA 2007. 2007. p. 306-309. 4378107. (Proceedings of the International Symposium on the Physical and Failure Analysis of Integrated Circuits, IPFA). doi: 10.1109/IPFA.2007.4378107

A simple and direct method for interface characterization of OFETs

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