Abstract
Iimited spatial resolution and low signal to noise ratio arc some of the main challenges in optical signal observation, especially lor photon emission microscopy. As dynamic emission signals are generated in a 3D space, the use of the time dimension in addition to space enables a better localization of switching events. It can actually be used to infer information with a precision above the resolution limits of the acquired signals. Taking advantage of this property, we report on a post- acquisition processing scheme to generate emission images with a better image resolution than the initial acquisition.
| Original language | English |
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| Title of host publication | ISTFA 2019 - Conference Proceedings from the 45th International Symposium for Testing and Failure Analysis |
| Publisher | ASM International |
| Pages | 68-78 |
| Number of pages | 11 |
| ISBN (Electronic) | 9781627082730 |
| Publication status | Published - 2019 |
| Externally published | Yes |
| Event | 45th International Symposium for Testing and Failure Analysis, ISTFA 2019 - Portland, United States Duration: Nov 10 2019 → Nov 14 2019 |
Publication series
| Name | Conference Proceedings from the International Symposium for Testing and Failure Analysis |
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Conference
| Conference | 45th International Symposium for Testing and Failure Analysis, ISTFA 2019 |
|---|---|
| Country/Territory | United States |
| City | Portland |
| Period | 11/10/19 → 11/14/19 |
Bibliographical note
Publisher Copyright:©2019 ASM International. All rights reserved.
ASJC Scopus Subject Areas
- Electrical and Electronic Engineering
- Control and Systems Engineering
- Safety, Risk, Reliability and Quality