Abstract
The ALCHEMI method for locating the sites of foreign atoms within crystals is known to be sensitive to the delocalized emission of X‐rays. This can result in large errors in some cases through differences in delocalization for different excitations or by error amplification in the ratio method of analysis. An alternative approach to the analysis of ALCHEMI data, using multivariate statistical analysis, is extended to the case of multiple impurities. Initial results from zone‐axis channelling experiments for a Yb‐doped zirconolite (CaZrTi2O7) are shown to confirm the improved accuracy of this method, especially for axial orientations. Data were collected using a 400‐keV analytical electron microscope fitted with an intrinsic Ge X‐ray detector. The potential advantages for ALCHEMI analysis of Ge detectors are considered. 1991 Blackwell Science Ltd
Original language | English |
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Pages (from-to) | 369-378 |
Number of pages | 10 |
Journal | Journal of Microscopy |
Volume | 162 |
Issue number | 3 |
DOIs | |
Publication status | Published - Jun 1991 |
Externally published | Yes |
ASJC Scopus Subject Areas
- Pathology and Forensic Medicine
- Histology
Keywords
- ALCHEMI
- delocalization
- electron channelling
- Ge detectors
- microanalysis
- X‐ray emission
- zone‐axis channelling