Abstract
The authors demonstrate organic ferroelectric field effect transistors using poly(vinylidene fluoride-trifluoroethylene) as dielectric in bottom common gate and patterned gate devices. Drain current hysteresis is resulted from the dipole switching at channel region due to gate-source bias. For common gate device, an additional anomalous polarization switching is observed due to gate-drain bias. This switching has no effect on the hysteresis direction yet incurs a strong peak in the off drain current leading to unstable and uncontrollable off state in memory device. Reduction of gate-drain overlapping using patterned metal gate shows diminishing the anomalous switching hence improves performance of the ferroelectric transistors.
Original language | English |
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Article number | 042909 |
Journal | Applied Physics Letters |
Volume | 91 |
Issue number | 4 |
DOIs | |
Publication status | Published - 2007 |
Externally published | Yes |
ASJC Scopus Subject Areas
- Physics and Astronomy (miscellaneous)