Anomalous polarization switching in organic ferroelectric field effect transistors

C. A. Nguyen*, P. S. Lee, N. Ng, H. Su, S. G. Mhaisalkar, J. Ma, F. Y.C. Boey

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

17 Citations (Scopus)

Abstract

The authors demonstrate organic ferroelectric field effect transistors using poly(vinylidene fluoride-trifluoroethylene) as dielectric in bottom common gate and patterned gate devices. Drain current hysteresis is resulted from the dipole switching at channel region due to gate-source bias. For common gate device, an additional anomalous polarization switching is observed due to gate-drain bias. This switching has no effect on the hysteresis direction yet incurs a strong peak in the off drain current leading to unstable and uncontrollable off state in memory device. Reduction of gate-drain overlapping using patterned metal gate shows diminishing the anomalous switching hence improves performance of the ferroelectric transistors.

Original languageEnglish
Article number042909
JournalApplied Physics Letters
Volume91
Issue number4
DOIs
Publication statusPublished - 2007
Externally publishedYes

ASJC Scopus Subject Areas

  • Physics and Astronomy (miscellaneous)

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