@inproceedings{1251209fc83444c88316d03000d6cb5b,
title = "Auger-type hole trapping process at green emission centers of ZnO Nanowires",
abstract = "The origins of the green emission (GE) from ZnO nanostructures remain highly controversial despite extensive studies. Herein, transient absorption spectroscopy (TAS) revealed a small Stokes shift of ∼180 meV between the GE-centers (located at ∼0.7 eV above the valence band) and the GE peak - yielding the first experimental evidence of the GE originating from charge transitions of the ZnO di-vacancies proposed recently in density functional calculations. TAS also uncovered an ultrafast Auger-type hole-trapping process to VZnO that occurs in a sub-ps timescale.",
author = "Sum, {Tze Chien} and Mingjie Li and Guichuan Xing and Tom Wu and Guozhong Xing",
year = "2013",
doi = "10.1364/cleo_qels.2013.qm3d.3",
language = "English",
isbn = "9781557529725",
series = "2013 Conference on Lasers and Electro-Optics, CLEO 2013",
publisher = "IEEE Computer Society",
booktitle = "2013 Conference on Lasers and Electro-Optics, CLEO 2013",
address = "United States",
note = "2013 Conference on Lasers and Electro-Optics, CLEO 2013 ; Conference date: 09-06-2013 Through 14-06-2013",
}