Abstract
Ferroelectric (Ba,Sr)TiO3 thin films have been prepared by RF co-sputtering process, and characterized using dielectric characterizations and gas sensing measurements for the H2 detection. Experimental results show that the leakage current of these co-sputtered BST thin films is closely related to the deposition parameters and electronic defects in the films. The I-V performances of our Pd/BST/Pt capacitive devices exhibit the typical Schottky behavior, both in air and in hydrogen gas. The turn-on voltage shift at 1024 ppm H2 gas diluted in air has been observed due to the H2 blocking effect by BST films at the interface with the catalytic Pd metal layer. It is believed that the electronic defects cause the degradation of the RF co-sputtered films to H2 gas detection, and weaken the induced H2 potential build-up across the space charge layer at the interface.
Original language | English |
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Pages (from-to) | 71-76 |
Number of pages | 6 |
Journal | Ferroelectrics |
Volume | 232 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - 1999 |
Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
Keywords
- (Ba; Sr)TiO thin film
- Gas sensor
- Sputtering