Bottom-contact poly(3,3‴-didodecylquaterthiophene) thin-film transistors with reduced contact resistance

Qin Jia Cai, Mary B. Chan-Park*, Jun Zhang, Ye Gan, Chang Ming Li, Tu Pei Chen, Beng S. Ong

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

18 Citations (Scopus)

Abstract

A dramatic, ∼20-fold, reduction in the contact resistance of the bottom-contact poly(3,3‴-didodecylquaterthiophene) (PQT-12) thin-film transistors was achieved through a simple treatment of gold (Au) source and drain electrodes. The Au electrode treatment involved simply immersing the Au electrodes into Piranha solution prior to the deposition of the organic semiconductor. This treatment led to significant improvement of device performance. Channel length scaling analysis indicates that the contact resistance is reduced by about one order of magnitude, resulting in enhancement of estimated field-effect mobility by about a factor of five. Transport characteristic analysis suggests that the improved efficiency of charge carrier injection is probably due to increased dopant density of PQT-12 at the electrode/PQT-12 interface.

Original languageEnglish
Pages (from-to)14-20
Number of pages7
JournalOrganic Electronics
Volume9
Issue number1
DOIs
Publication statusPublished - Feb 2008
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Biomaterials
  • General Chemistry
  • Condensed Matter Physics
  • Materials Chemistry
  • Electrical and Electronic Engineering

Keywords

  • Contact resistance
  • Electrodes
  • Interface
  • Poly(3,3‴-didodecylquaterthiophene)
  • Thin-film transistors
  • Treatment

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