Breaking limit of atomic distance in an impurity-free monatomic chain

Chang Q. Sun*, C. M. Li, S. Li, B. K. Tay

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

41 Citations (Scopus)

Abstract

An analytical solution shows that the maximal strain of an impurity-free metallic monatomic chain (MC), or a defect-free nanowire (NW), varies inapparently with mechanical stress but apparently with the separation between the melting point [Tm(K)] and the temperature of operation in terms of exp{[Tm(K)-T]-1}, where K is the dimension of the NW (for a MC, K = 1.5). Reconciliation of the measured data of Au-MC breaking limit suggests that the discrepancy in measurement arises from thermal and mechanical fluctuations near the Tm of the MC that is (1/4.2)-fold of the bulk value. Findings also favor the mechanism for the high extensibility of a nanograined NW and further indicate that bond unfolding of the lower-coordinated atoms dominates the grain boundary activities, particularly at temperatures approaching surface melting.

Original languageEnglish
Article number245402
Pages (from-to)245402-1-245402-6
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume69
Issue number24
DOIs
Publication statusPublished - Jun 2004
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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