Brillouin spectroscopy of acoustic modes in porous silicon films

H. J. Fan, M. H. Kuok, S. C. Ng, R. Boukherroub, J. M. Baribeau, J. W. Fraser, D. J. Lockwood

Research output: Contribution to journalArticlepeer-review

35 Citations (Scopus)

Abstract

A systematic Brillouin study has been carried out on acoustic modes in porous silicon films prepared from p-type Si(100). A surface Rayleigh mode and two bulk acoustic modes, transverse and longitudinal, were observed. Results are presented for the dependence of the phase velocities of these three modes on sample porosity and film thickness. The phonon velocities, especially those of the bulk modes, increase sharply with decreasing film thickness below ∼10 μm. This thickness dependence is attributed to the presence of a transition layer between the porous silicon film and crystalline Si substrate. Its influence on the film bulk modes increases with decreasing thickness. Elastic constants and Young's modulus of porous Si are estimated for different porosities from the phase velocities of the two bulk acoustic modes and are compared with the corresponding data obtained by other techniques.

Original languageEnglish
Article number165330
Pages (from-to)1653301-1653308
Number of pages8
JournalPhysical Review B - Condensed Matter and Materials Physics
Volume65
Issue number16
DOIs
Publication statusPublished - Apr 15 2002
Externally publishedYes

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics

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