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Characterisation of defects generated during constant current InGaN-on-silicon LED operation
R. I. Made, Yu Gao, G. J. Syaranamual, W. A. Sasangka, L. Zhang, Xuan Sang Nguyen, Y. Y. Tay, J. S. Herrin, C. V. Thompson, C. L. Gan*
*Corresponding author for this work
Research output: Contribution to journal › Article › peer-review
9
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(Scopus)