Chemical Vapor Deposition of High-Quality and Atomically Layered ReS2

Xuexia He, Fucai Liu, Peng Hu, Wei Fu, Xingli Wang, Qingsheng Zeng, Wu Zhao*, Zheng Liu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

132 Citations (Scopus)

Abstract

Recently, anisotropic 2D materials, such as black phosphorus and rhenium disulfides (ReS2), have attracted a lot attention because of their unique applications on electronics and optoelectronics. In this work, the direct growth of high-quality ReS2 atomic layers and nanoribbons has been demonstrated by using chemical vapor deposition (CVD) method. A possible growth mechanism is proposed according to the controlled experiments. The CVD ReS2-based filed-effect transistors (FETs) show n-type semiconducting behavior with a current on/off ratio of ≈106 and a charge carrier mobility of ≈9.3 cm2 Vs-1. These results suggested that the quality of CVD grown ReS2 is comparable to mechanically exfoliated ReS2, which is also further supported by atomic force microscopy imaging, high-resolution transmission electron microscopy imaging and thickness-dependent Raman spectra. The study here indicates that CVD grown ReS2 may pave the way for the large-scale fabrication of ReS2-based high-performance optoelectronic devices, such as anisotropic FETs and polarization detection.

Original languageEnglish
Pages (from-to)5423-5429
Number of pages7
JournalSmall
Volume11
Issue number40
DOIs
Publication statusPublished - Oct 1 2015
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2015 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.

ASJC Scopus Subject Areas

  • Biotechnology
  • Biomaterials
  • General Chemistry
  • General Materials Science

Keywords

  • 2D materials
  • anisotropy
  • chemical vapor deposition
  • field effect transistors
  • rhenium disulphide

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