Abstract
We compare sol-gel Pb(Zr0.3Ti0.7)O3 (PZT) film and Pb(Zr0.3Ti0.7)O3/PbTiO3 (PZT/PT) multilayer film for pyroelectric infrared detector application. The microstructure, dielectric, ferroelectric and pyroelectric properties of the pure PZT and PZT/PT multilayer thin films are investigated. The results indicate that the multilayer thin film exhibits lower dielectric constant and lower dielectric loss, which is beneficial for higher figure of merit (FOM). Although the pyroelectric coefficient of the PZT/PT multilayer thin film is 14% lower than that of the pure PZT thin film, the detectivity figures of merit of PZT/PT multilayer thin film is 17% higher than that of the pure PZT thin film due to the reduced dielectric constant and dielectric loss tangent. It is evident that the PZT/PT multilayer thin film is a promising candidate for infrared detection application.
Original language | English |
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Pages (from-to) | 738-744 |
Number of pages | 7 |
Journal | Microelectronic Engineering |
Volume | 66 |
Issue number | 1-4 |
DOIs | |
Publication status | Published - Apr 2003 |
Externally published | Yes |
Event | IUMRS-ICEM 2002 - Xi an, China Duration: Jun 10 2002 → Jun 14 2002 |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
Keywords
- Multilayer thin film
- Pyroelectric
- PZT
- Sol-gel