Conducting Ni nanoparticles in an ion-modified polymer

J. Y. Sze; B. K. Tay; C. I. Pakes; D. N. Jamieson; S. Prawer

doi:10.1063/1.2014938

Conducting Ni nanoparticles in an ion-modified polymer

J. Y. Sze^*, B. K. Tay, C. I. Pakes, D. N. Jamieson, S. Prawer

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

17 Citations (Scopus)

Abstract

Conductive-atomic force microscopy has been used to perform nanoscale current imaging of Ni-ion-implanted polythylene terephthlate films. A reduction in bulk sheet resistivity, as the Ni dose is increased, is found to be accompanied by an evolution in local conductivity from a spatially homogeneous insulator to an interconnected network of conducting Ni crystallites. The crystallites have a mean dimension of 12.3 nm, confirmed by x-ray-diffraction analysis.

Original language	English
Article number	066101
Journal	Journal of Applied Physics
Volume	98
Issue number	6
DOIs	https://doi.org/10.1063/1.2014938
Publication status	Published - Sept 15 2005
Externally published	Yes

ASJC Scopus Subject Areas

General Physics and Astronomy

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title = "Conducting Ni nanoparticles in an ion-modified polymer",

abstract = "Conductive-atomic force microscopy has been used to perform nanoscale current imaging of Ni-ion-implanted polythylene terephthlate films. A reduction in bulk sheet resistivity, as the Ni dose is increased, is found to be accompanied by an evolution in local conductivity from a spatially homogeneous insulator to an interconnected network of conducting Ni crystallites. The crystallites have a mean dimension of 12.3 nm, confirmed by x-ray-diffraction analysis.",

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AU - Sze, J. Y.

AU - Tay, B. K.

AU - Pakes, C. I.

AU - Jamieson, D. N.

AU - Prawer, S.

PY - 2005/9/15

Y1 - 2005/9/15

N2 - Conductive-atomic force microscopy has been used to perform nanoscale current imaging of Ni-ion-implanted polythylene terephthlate films. A reduction in bulk sheet resistivity, as the Ni dose is increased, is found to be accompanied by an evolution in local conductivity from a spatially homogeneous insulator to an interconnected network of conducting Ni crystallites. The crystallites have a mean dimension of 12.3 nm, confirmed by x-ray-diffraction analysis.

AB - Conductive-atomic force microscopy has been used to perform nanoscale current imaging of Ni-ion-implanted polythylene terephthlate films. A reduction in bulk sheet resistivity, as the Ni dose is increased, is found to be accompanied by an evolution in local conductivity from a spatially homogeneous insulator to an interconnected network of conducting Ni crystallites. The crystallites have a mean dimension of 12.3 nm, confirmed by x-ray-diffraction analysis.

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Conducting Ni nanoparticles in an ion-modified polymer

Abstract

ASJC Scopus Subject Areas

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