Correction of the Seemann-Bohlin method for stress measurements in thin films

Yu Ligen; Sun Hailin; Xu Kewei; He Jiawen

doi:10.1107/S0021889894004036

Correction of the Seemann-Bohlin method for stress measurements in thin films

Yu Ligen^*, Sun Hailin, Xu Kewei, He Jiawen

^*Corresponding author for this work

Xi'an Jiaotong University

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

The deviation of X-ray data measured by the Seemann-Bohlin method from the predicted linear relationship is studied. A linear d versus sin² ψ relation can be achieved by a modification of the theory based on an average of the Voigt and Reuss models. However, because the Seemann-Bohlin method has to use low 2θ values, it is intrinsically less accurate than the Bragg-Brentano method, particularly for low stress values.

Original language	English
Pages (from-to)	863-867
Number of pages	5
Journal	Journal of Applied Crystallography
Volume	27
Issue number	pt 6
DOIs	https://doi.org/10.1107/S0021889894004036
Publication status	Published - Dec 1 1994
Externally published	Yes

ASJC Scopus Subject Areas

General Biochemistry,Genetics and Molecular Biology

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title = "Correction of the Seemann-Bohlin method for stress measurements in thin films",

abstract = "The deviation of X-ray data measured by the Seemann-Bohlin method from the predicted linear relationship is studied. A linear d versus sin2 ψ relation can be achieved by a modification of the theory based on an average of the Voigt and Reuss models. However, because the Seemann-Bohlin method has to use low 2θ values, it is intrinsically less accurate than the Bragg-Brentano method, particularly for low stress values.",

author = "Yu Ligen and Sun Hailin and Xu Kewei and He Jiawen",

year = "1994",

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T1 - Correction of the Seemann-Bohlin method for stress measurements in thin films

AU - Ligen, Yu

AU - Hailin, Sun

AU - Kewei, Xu

AU - Jiawen, He

PY - 1994/12/1

Y1 - 1994/12/1

N2 - The deviation of X-ray data measured by the Seemann-Bohlin method from the predicted linear relationship is studied. A linear d versus sin2 ψ relation can be achieved by a modification of the theory based on an average of the Voigt and Reuss models. However, because the Seemann-Bohlin method has to use low 2θ values, it is intrinsically less accurate than the Bragg-Brentano method, particularly for low stress values.

AB - The deviation of X-ray data measured by the Seemann-Bohlin method from the predicted linear relationship is studied. A linear d versus sin2 ψ relation can be achieved by a modification of the theory based on an average of the Voigt and Reuss models. However, because the Seemann-Bohlin method has to use low 2θ values, it is intrinsically less accurate than the Bragg-Brentano method, particularly for low stress values.

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JO - Journal of Applied Crystallography

JF - Journal of Applied Crystallography

IS - pt 6

ER -

Correction of the Seemann-Bohlin method for stress measurements in thin films

Abstract

ASJC Scopus Subject Areas

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