Abstract
This study investigates the ceramic to ceramic bonding, using composite glass frit as the binding layer that is able to tolerate a high temperature environment for ruggedized microelectronic applications. Shear strength measurements were carried out at both room and high temperature (i.e. 250 °C) to evaluate room and high temperature performance of the joints. The glass joints in both the Al2O3/glass/Al2O3 and AlN/glass/AlN systems maintained their integrity even when shear-tested at 250°C. The results of the mechanical and microstructural characterizations demonstrate that Bi-based two phase glass frit bonding is an effective ceramic bonding method for harsh-environment electronic packaging.
Original language | English |
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Pages (from-to) | 2905-2910 |
Number of pages | 6 |
Journal | Microelectronics Reliability |
Volume | 54 |
Issue number | 12 |
DOIs | |
Publication status | Published - Dec 1 2014 |
Externally published | Yes |
Bibliographical note
Publisher Copyright:© 2014 Elsevier Ltd. All rights reserved.
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Safety, Risk, Reliability and Quality
- Condensed Matter Physics
- Surfaces, Coatings and Films
- Electrical and Electronic Engineering
Keywords
- Ceramic substrates
- Electronics packaging
- Harsh environment
- High-temperature reliability
- Pb-free glass frit