Damage Quantification Using EMI Technique

S. Bhalla; Y. W. Yang; J. F. Xu; C. K. Soh

doi:10.1007/978-3-642-24463-6_4

Damage Quantification Using EMI Technique

S. Bhalla, Y. W. Yang, J. F. Xu, C. K. Soh

President's Office

Indian Institute of Technology Delhi

Research output: Chapter in Book/Report/Conference proceeding › Chapter

4 Citations (Scopus)

Abstract

This section outlines a computational procedure to extract the mechanical impedance of the host structure from the EM admittance signatures of the surface-bonded PZT patches.

Original language	English
Title of host publication	Advanced Topics in Science and Technology in China
Publisher	Springer Science and Business Media Deutschland GmbH
Pages	129-186
Number of pages	58
DOIs	https://doi.org/10.1007/978-3-642-24463-6_4
Publication status	Published - 2012

Publication series

Name	Advanced Topics in Science and Technology in China
ISSN (Print)	1995-6819
ISSN (Electronic)	1995-6827

Bibliographical note

Publisher Copyright:
© 2012, Zhejiang University Press, Hangzhou and Springer-Verlag Berlin Heidelberg.

ASJC Scopus Subject Areas

General Chemical Engineering
General Engineering
General

Keywords

Damage Diagnosis
Damage Identification
Mechanical Impedance
Mode Shape
Sensitive Mode

Access to Document

10.1007/978-3-642-24463-6_4

Cite this

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title = "Damage Quantification Using EMI Technique",

abstract = "This section outlines a computational procedure to extract the mechanical impedance of the host structure from the EM admittance signatures of the surface-bonded PZT patches.",

keywords = "Damage Diagnosis, Damage Identification, Mechanical Impedance, Mode Shape, Sensitive Mode",

author = "S. Bhalla and Yang, {Y. W.} and Xu, {J. F.} and Soh, {C. K.}",

note = "Publisher Copyright: {\textcopyright} 2012, Zhejiang University Press, Hangzhou and Springer-Verlag Berlin Heidelberg.",

year = "2012",

doi = "10.1007/978-3-642-24463-6_4",

language = "English",

series = "Advanced Topics in Science and Technology in China",

publisher = "Springer Science and Business Media Deutschland GmbH",

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booktitle = "Advanced Topics in Science and Technology in China",

address = "Germany",

}

TY - CHAP

T1 - Damage Quantification Using EMI Technique

AU - Bhalla, S.

AU - Yang, Y. W.

AU - Xu, J. F.

AU - Soh, C. K.

PY - 2012

Y1 - 2012

N2 - This section outlines a computational procedure to extract the mechanical impedance of the host structure from the EM admittance signatures of the surface-bonded PZT patches.

AB - This section outlines a computational procedure to extract the mechanical impedance of the host structure from the EM admittance signatures of the surface-bonded PZT patches.

KW - Damage Diagnosis

KW - Damage Identification

KW - Mechanical Impedance

KW - Mode Shape

KW - Sensitive Mode

UR - http://www.scopus.com/inward/record.url?scp=85060714858&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=85060714858&partnerID=8YFLogxK

U2 - 10.1007/978-3-642-24463-6_4

DO - 10.1007/978-3-642-24463-6_4

M3 - Chapter

AN - SCOPUS:85060714858

T3 - Advanced Topics in Science and Technology in China

SP - 129

EP - 186

BT - Advanced Topics in Science and Technology in China

PB - Springer Science and Business Media Deutschland GmbH

ER -

Damage Quantification Using EMI Technique

Abstract

Publication series

Bibliographical note

ASJC Scopus Subject Areas

Keywords

Access to Document

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