Abstract
In this paper we describe how dark-field and differential phase contrast imaging modes can be incorporated into a commercial confocal microscope. These investigations are based on the application of our previously described half-stop dark-field confocal micrescope (Török et at J, Microscopy 181 (1996) 260-268, Laczik et al Inst. Phys Conf. Ser. No 146 (1995) 767-770) and essentially involve digital image processing methods. The theory is discussed together with some experimental images obtained on biological and surface topography specimens.
| Original language | English |
|---|---|
| Pages (from-to) | 101-106 |
| Number of pages | 6 |
| Journal | Optik |
| Volume | 103 |
| Issue number | 3 |
| Publication status | Published - Sept 1996 |
| Externally published | Yes |
ASJC Scopus Subject Areas
- Electronic, Optical and Magnetic Materials
- Atomic and Molecular Physics, and Optics
- Electrical and Electronic Engineering