Defect induced enhancement of exchange bias by swift heavy ion irradiation in zinc ferrite-FeNiMoB alloy based bilayer films

R. Lisha; T. Hysen; P. Geetha; P. B. Aravind; M. Shareef; A. Shamlath; Sunil Ojha; R. V. Ramanujan; M. R. Anantharaman

doi:10.1016/j.nimb.2015.07.129

Defect induced enhancement of exchange bias by swift heavy ion irradiation in zinc ferrite-FeNiMoB alloy based bilayer films

R. Lisha, T. Hysen, P. Geetha, P. B. Aravind, M. Shareef, A. Shamlath, Sunil Ojha, R. V. Ramanujan, M. R. Anantharaman^*

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

Exchange biased systems consisting of ferromagnetic (FM)-antiferromagnetic (AFM) interfaces are increasingly being investigated because of their application potential in spin valves and tunnel junctions. In bilayer systems, ion irradiation is capable of modifying the interface and thereby offers unique opportunities to tailor exchange field. In the present study, irradiation with 100 MeV Ag⁸⁺ ions is utilized to alter the exchange bias field in zinc ferrite-FeNiMoB bilayer system. The thin films which were deposited by RF sputtering technique and annealed at 600 °C were irradiated at various fluences. Structural and magnetic studies were carried out by using Glancing X Ray Diffractometer (GXRD) and Superconducting Quantum Interference Device Vibrating Sample Magnetometer (SQUID VSM) respectively. It was observed that the as deposited films exhibited exchange bias and on ion irradiation, bias field could be enhanced at certain fluences. The enhancement in bias field is attributed to defects created in the antiferromagnet as a result of ion irradiation. The experimental result is fitted in accordance with the diluted antiferromagnet model. Coercivity was also found to vary with ion fluence. Ion fluence was thus effectively used to enhance bias field as well as coercivity in the bilayer consisting of zinc ferrite-FeNiMoB.

Original language	English
Pages (from-to)	68-74
Number of pages	7
Journal	Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms
Volume	360
DOIs	https://doi.org/10.1016/j.nimb.2015.07.129
Publication status	Published - Oct 1 2015
Externally published	Yes

Bibliographical note

Publisher Copyright:
© 2015 Published by Elsevier B.V.

ASJC Scopus Subject Areas

Nuclear and High Energy Physics
Instrumentation

Keywords

Exchange bias
Fluence
SHI
Zinc ferrite

Access to Document

10.1016/j.nimb.2015.07.129

Cite this

Lisha, R., Hysen, T., Geetha, P., Aravind, P. B., Shareef, M., Shamlath, A., Ojha, S., Ramanujan, R. V., & Anantharaman, M. R. (2015). Defect induced enhancement of exchange bias by swift heavy ion irradiation in zinc ferrite-FeNiMoB alloy based bilayer films. Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, 360, 68-74. https://doi.org/10.1016/j.nimb.2015.07.129

@article{3b5df4de851744fb83e4157a8a4b372d,

title = "Defect induced enhancement of exchange bias by swift heavy ion irradiation in zinc ferrite-FeNiMoB alloy based bilayer films",

abstract = "Exchange biased systems consisting of ferromagnetic (FM)-antiferromagnetic (AFM) interfaces are increasingly being investigated because of their application potential in spin valves and tunnel junctions. In bilayer systems, ion irradiation is capable of modifying the interface and thereby offers unique opportunities to tailor exchange field. In the present study, irradiation with 100 MeV Ag8+ ions is utilized to alter the exchange bias field in zinc ferrite-FeNiMoB bilayer system. The thin films which were deposited by RF sputtering technique and annealed at 600 °C were irradiated at various fluences. Structural and magnetic studies were carried out by using Glancing X Ray Diffractometer (GXRD) and Superconducting Quantum Interference Device Vibrating Sample Magnetometer (SQUID VSM) respectively. It was observed that the as deposited films exhibited exchange bias and on ion irradiation, bias field could be enhanced at certain fluences. The enhancement in bias field is attributed to defects created in the antiferromagnet as a result of ion irradiation. The experimental result is fitted in accordance with the diluted antiferromagnet model. Coercivity was also found to vary with ion fluence. Ion fluence was thus effectively used to enhance bias field as well as coercivity in the bilayer consisting of zinc ferrite-FeNiMoB.",

keywords = "Exchange bias, Fluence, SHI, Zinc ferrite",

author = "R. Lisha and T. Hysen and P. Geetha and Aravind, {P. B.} and M. Shareef and A. Shamlath and Sunil Ojha and Ramanujan, {R. V.} and Anantharaman, {M. R.}",

note = "Publisher Copyright: {\textcopyright} 2015 Published by Elsevier B.V.",

year = "2015",

month = oct,

day = "1",

doi = "10.1016/j.nimb.2015.07.129",

language = "English",

volume = "360",

pages = "68--74",

journal = "Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms",

issn = "0168-583X",

publisher = "Elsevier",

}

Lisha, R, Hysen, T, Geetha, P, Aravind, PB, Shareef, M, Shamlath, A, Ojha, S, Ramanujan, RV & Anantharaman, MR 2015, 'Defect induced enhancement of exchange bias by swift heavy ion irradiation in zinc ferrite-FeNiMoB alloy based bilayer films', Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, vol. 360, pp. 68-74. https://doi.org/10.1016/j.nimb.2015.07.129

Defect induced enhancement of exchange bias by swift heavy ion irradiation in zinc ferrite-FeNiMoB alloy based bilayer films. / Lisha, R.; Hysen, T.; Geetha, P. et al.
In: Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms, Vol. 360, 01.10.2015, p. 68-74.

Research output: Contribution to journal › Article › peer-review

TY - JOUR

T1 - Defect induced enhancement of exchange bias by swift heavy ion irradiation in zinc ferrite-FeNiMoB alloy based bilayer films

AU - Lisha, R.

AU - Hysen, T.

AU - Geetha, P.

AU - Aravind, P. B.

AU - Shareef, M.

AU - Shamlath, A.

AU - Ojha, Sunil

AU - Ramanujan, R. V.

AU - Anantharaman, M. R.

PY - 2015/10/1

Y1 - 2015/10/1

N2 - Exchange biased systems consisting of ferromagnetic (FM)-antiferromagnetic (AFM) interfaces are increasingly being investigated because of their application potential in spin valves and tunnel junctions. In bilayer systems, ion irradiation is capable of modifying the interface and thereby offers unique opportunities to tailor exchange field. In the present study, irradiation with 100 MeV Ag8+ ions is utilized to alter the exchange bias field in zinc ferrite-FeNiMoB bilayer system. The thin films which were deposited by RF sputtering technique and annealed at 600 °C were irradiated at various fluences. Structural and magnetic studies were carried out by using Glancing X Ray Diffractometer (GXRD) and Superconducting Quantum Interference Device Vibrating Sample Magnetometer (SQUID VSM) respectively. It was observed that the as deposited films exhibited exchange bias and on ion irradiation, bias field could be enhanced at certain fluences. The enhancement in bias field is attributed to defects created in the antiferromagnet as a result of ion irradiation. The experimental result is fitted in accordance with the diluted antiferromagnet model. Coercivity was also found to vary with ion fluence. Ion fluence was thus effectively used to enhance bias field as well as coercivity in the bilayer consisting of zinc ferrite-FeNiMoB.

AB - Exchange biased systems consisting of ferromagnetic (FM)-antiferromagnetic (AFM) interfaces are increasingly being investigated because of their application potential in spin valves and tunnel junctions. In bilayer systems, ion irradiation is capable of modifying the interface and thereby offers unique opportunities to tailor exchange field. In the present study, irradiation with 100 MeV Ag8+ ions is utilized to alter the exchange bias field in zinc ferrite-FeNiMoB bilayer system. The thin films which were deposited by RF sputtering technique and annealed at 600 °C were irradiated at various fluences. Structural and magnetic studies were carried out by using Glancing X Ray Diffractometer (GXRD) and Superconducting Quantum Interference Device Vibrating Sample Magnetometer (SQUID VSM) respectively. It was observed that the as deposited films exhibited exchange bias and on ion irradiation, bias field could be enhanced at certain fluences. The enhancement in bias field is attributed to defects created in the antiferromagnet as a result of ion irradiation. The experimental result is fitted in accordance with the diluted antiferromagnet model. Coercivity was also found to vary with ion fluence. Ion fluence was thus effectively used to enhance bias field as well as coercivity in the bilayer consisting of zinc ferrite-FeNiMoB.

KW - Exchange bias

KW - Fluence

KW - SHI

KW - Zinc ferrite

UR - http://www.scopus.com/inward/record.url?scp=84940416797&partnerID=8YFLogxK

UR - http://www.scopus.com/inward/citedby.url?scp=84940416797&partnerID=8YFLogxK

U2 - 10.1016/j.nimb.2015.07.129

DO - 10.1016/j.nimb.2015.07.129

M3 - Article

AN - SCOPUS:84940416797

SN - 0168-583X

VL - 360

SP - 68

EP - 74

JO - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

JF - Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

ER -

Defect induced enhancement of exchange bias by swift heavy ion irradiation in zinc ferrite-FeNiMoB alloy based bilayer films

Abstract

Bibliographical note

ASJC Scopus Subject Areas

Keywords

Access to Document

Other files and links

Fingerprint

Cite this