Delving into High-Quality Synthetic Face Occlusion Segmentation Datasets

Kenny T.R. Voo, Liming Jiang, Chen Change Loy

Research output: Chapter in Book/Report/Conference proceedingConference contribution

23 Citations (Scopus)

Abstract

This paper performs comprehensive analysis on datasets for occlusion-aware face segmentation, a task that is crucial for many downstream applications. The collection and annotation of such datasets are time-consuming and labor-intensive. Although some efforts have been made in synthetic data generation, the naturalistic aspect of data remains less explored. In our study, we propose two occlusion generation techniques, Naturalistic Occlusion Generation (NatOcc), for producing high-quality naturalistic synthetic occluded faces; and Random Occlusion Generation (RandOcc), a more general synthetic occluded data generation method (Figure 1). We empirically show the effectiveness and robustness of both methods, even for unseen occlusions. To facilitate model evaluation, we present two high-resolution real-world occluded face datasets with finegrained annotations, RealOcc and RealOcc-Wild, featuring both careful alignment preprocessing and an in-the-wild setting for robustness test. We further conduct a comprehensive analysis on a newly introduced segmentation benchmark, offering insights for future exploration. Our code and dataset are available at https://github.com/kennyvoo/face-occlusion-generation.

Original languageEnglish
Title of host publicationProceedings - 2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
PublisherIEEE Computer Society
Pages4710-4719
Number of pages10
ISBN (Electronic)9781665487399
DOIs
Publication statusPublished - 2022
Externally publishedYes
Event2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022 - New Orleans, United States
Duration: Jun 19 2022Jun 24 2022

Publication series

NameIEEE Computer Society Conference on Computer Vision and Pattern Recognition Workshops
Volume2022-June
ISSN (Print)2160-7508
ISSN (Electronic)2160-7516

Conference

Conference2022 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops, CVPRW 2022
Country/TerritoryUnited States
CityNew Orleans
Period6/19/226/24/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

ASJC Scopus Subject Areas

  • Computer Vision and Pattern Recognition
  • Electrical and Electronic Engineering

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