Determination of coverage in passivated porous silicon by Brillouin spectroscopy

H. J. Fan; M. H. Kuok; S. C. Ng; R. Boukherroub; D. J. Lockwood

doi:10.1063/1.1428628

Determination of coverage in passivated porous silicon by Brillouin spectroscopy

H. J. Fan^*, M. H. Kuok, S. C. Ng, R. Boukherroub, D. J. Lockwood

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

Brillouin scattering has been performed to probe surface acoustic waves in porous silicon films that have been chemically modified with various surface passivators. The surface Rayleigh mode and two film acoustic modes are observed. Unlike the Rayleigh mode, the two film modes are found to exhibit velocity dispersion. The effect of passivation is manifested as a shift of Brillouin peaks to lower frequencies relative to those of the freshly prepared porous silicon samples. The coverage of the surface area of the pores of the entire porous layers by the respective chemical passivators has been estimated from the phase velocity of one of the film modes.

Original language	English
Pages (from-to)	4521-4523
Number of pages	3
Journal	Applied Physics Letters
Volume	79
Issue number	27
DOIs	https://doi.org/10.1063/1.1428628
Publication status	Published - Dec 31 2001
Externally published	Yes

ASJC Scopus Subject Areas

Physics and Astronomy (miscellaneous)

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abstract = "Brillouin scattering has been performed to probe surface acoustic waves in porous silicon films that have been chemically modified with various surface passivators. The surface Rayleigh mode and two film acoustic modes are observed. Unlike the Rayleigh mode, the two film modes are found to exhibit velocity dispersion. The effect of passivation is manifested as a shift of Brillouin peaks to lower frequencies relative to those of the freshly prepared porous silicon samples. The coverage of the surface area of the pores of the entire porous layers by the respective chemical passivators has been estimated from the phase velocity of one of the film modes.",

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AU - Fan, H. J.

AU - Kuok, M. H.

AU - Ng, S. C.

AU - Boukherroub, R.

AU - Lockwood, D. J.

PY - 2001/12/31

Y1 - 2001/12/31

N2 - Brillouin scattering has been performed to probe surface acoustic waves in porous silicon films that have been chemically modified with various surface passivators. The surface Rayleigh mode and two film acoustic modes are observed. Unlike the Rayleigh mode, the two film modes are found to exhibit velocity dispersion. The effect of passivation is manifested as a shift of Brillouin peaks to lower frequencies relative to those of the freshly prepared porous silicon samples. The coverage of the surface area of the pores of the entire porous layers by the respective chemical passivators has been estimated from the phase velocity of one of the film modes.

AB - Brillouin scattering has been performed to probe surface acoustic waves in porous silicon films that have been chemically modified with various surface passivators. The surface Rayleigh mode and two film acoustic modes are observed. Unlike the Rayleigh mode, the two film modes are found to exhibit velocity dispersion. The effect of passivation is manifested as a shift of Brillouin peaks to lower frequencies relative to those of the freshly prepared porous silicon samples. The coverage of the surface area of the pores of the entire porous layers by the respective chemical passivators has been estimated from the phase velocity of one of the film modes.

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JF - Applied Physics Letters

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Determination of coverage in passivated porous silicon by Brillouin spectroscopy

Abstract

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