Direct measurement of proton-beam-written polymer optical waveguide sidewall morphorlogy using an atomic force microscope

T. C. Sum*, A. A. Bettiol, H. L. Seng, J. A. Van Kan, F. Watt

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

19 Citations (Scopus)

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Engineering

Material Science