Direct Observation of Indium Conductive Filaments in Transparent, Flexible, and Transferable Resistive Switching Memory

Kai Qian, Roland Yingjie Tay, Meng Fang Lin, Jingwei Chen, Huakai Li, Jinjun Lin, Jiangxin Wang, Guofa Cai, Viet Cuong Nguyen, Edwin Hang Tong Teo, Tupei Chen, Pooi See Lee*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

96 Citations (Scopus)

Abstract

Electronics with multifunctionalities such as transparency, portability, and flexibility are anticipated for future circuitry development. Flexible memory is one of the indispensable elements in a hybrid electronic integrated circuit as the information storage device. Herein, we demonstrate a transparent, flexible, and transferable hexagonal boron nitride (hBN)-based resistive switching memory with indium tin oxide (ITO) and graphene electrodes on soft polydimethylsiloxane (PDMS) substrate. The ITO/hBN/graphene/PDMS memory device not only exhibits excellent performance in terms of optical transmittance (∼85% in the visible wavelength), ON/OFF ratio (∼480), retention time (∼5 × 104 s) but also shows robust flexibility under bending conditions and stable operation on arbitrary substrates. More importantly, direct observation of indium filaments in an ITO/hBN/graphene device is found via ex situ transmission electron microscopy, which provides critical insight on the complex resistive switching mechanisms.

Original languageEnglish
Pages (from-to)1712-1718
Number of pages7
JournalACS Nano
Volume11
Issue number2
DOIs
Publication statusPublished - Feb 28 2017
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 2017 American Chemical Society.

ASJC Scopus Subject Areas

  • General Materials Science
  • General Engineering
  • General Physics and Astronomy

Keywords

  • ex situ TEM
  • graphene
  • hexagonal boron nitride
  • indium filament
  • transferable memory
  • transparent and flexible memory

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