Distinguishing the effect of surface passivation from the effect of size on the photonic and electronic behavior of porous silicon

L. K. Pan*, Cheng Q. Sun, G. Q. Yu, Q. Y. Zhang, Y. Q. Fu, B. K. Tay

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

8 Citations (Scopus)

Abstract

CF4 plasma-passivation enhanced size dependence of the blueshift in photoemission (PL) and photoabsorption (PA), E2p-level shift, and band-gap expansion of porous silicon was investigated. It was shown that fluorination further enhances the crystal binding intensity. Bond Order-length-strength (BOLS) correlation enabled to unify the observed blueshift in the PL and PA, the energy shift of the Si-2p core level, as well as the dielectric suppression to the effect of atomic coordination number (CN) imperfection of atoms. The BOLS also enabled to discriminate the contribution from bond relaxation and bond nature alteration to both the crystal binding and electron-phonon coupling.

Original languageEnglish
Pages (from-to)1704-1708
Number of pages5
JournalJournal of Applied Physics
Volume96
Issue number3
DOIs
Publication statusPublished - Aug 1 2004
Externally publishedYes

ASJC Scopus Subject Areas

  • General Physics and Astronomy

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