Abstract
In this paper, we propose dynamic write-level and read-level voltage scheme for MLC NAND flash memory. We study the characteristics of flash channel which can be modeled as mixture of Uniform and Exponential distribution. Since this channel shows non-stationary behavior, we present probability of error analysis and introduce the concept of dynamically adjusting the verify-level (write-level) and quantization-level (read-level) voltage values over varying flash channel. The proposed dynamic voltage based method outperforms fixed verify-level voltage scheme. We demonstrate improvements in bit-error-rate (BER) performance and cell storage capacity for the proposed signal design scheme.
Original language | English |
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Title of host publication | 2014 9th International Symposium on Communication Systems, Networks and Digital Signal Processing, CSNDSP 2014 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 336-341 |
Number of pages | 6 |
ISBN (Electronic) | 9781479925810 |
DOIs | |
Publication status | Published - Oct 14 2014 |
Externally published | Yes |
Event | 2014 9th International Symposium on Communication Systems, Networks and Digital Signal Processing, CSNDSP 2014 - Manchester, United Kingdom Duration: Jul 23 2014 → Jul 25 2014 |
Publication series
Name | 2014 9th International Symposium on Communication Systems, Networks and Digital Signal Processing, CSNDSP 2014 |
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Conference
Conference | 2014 9th International Symposium on Communication Systems, Networks and Digital Signal Processing, CSNDSP 2014 |
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Country/Territory | United Kingdom |
City | Manchester |
Period | 7/23/14 → 7/25/14 |
Bibliographical note
Publisher Copyright:© 2014 IEEE.
ASJC Scopus Subject Areas
- Signal Processing
- Computer Networks and Communications
Keywords
- BER
- MLC NAND Flash
- PE
- quantization-level
- verify-level