Effect of annealing temperature on microstructure and UV light photocatalytic activity of TiO2 films grown by atmospheric pressure CVD

Chin Sheng Chua*, Xiaoqin Fang, Xiaofeng Chen, Ooi Kiang Tan, Man Siu Tse, Andrew Mc Intosh Soutar, Xingzhao Ding

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

16 Citations (Scopus)

Abstract

Titanium dioxide (TiO2) films are deposited on quartz substrates by atmospheric pressure (AP)CVD, and then annealed under simulated air (80% nitrogen, 20% oxygen) at temperatures from 600 to 900°C to investigate the change in microstructure and the effect on the photocatalytic activity on the simulated pollutant stearic acid. The as-deposited TiO2 film is mainly composed of pure anatase phase while the rutile phase is detected only after annealing the film at 900°C for 1 h. The photocatalytic activity of the annealed films on stearic acid underUVirradiation is found to deteriorate after the films are annealed at temperatures above 700°C. This decrease in photocatalytic performance is observed to be the result of two possible mechanisms induced by the annealing temperature. The first mechanism is the increase in defect concentration (O- and Ti vacancies) in the annealed TiO2 films for annealing temperatures below 800°C, and the second mechanism is the formation of large rutile grains at a higher temperature, 900°C.

Original languageEnglish
Pages (from-to)44-50
Number of pages7
JournalChemical Vapor Deposition
Volume20
Issue number1-3
DOIs
Publication statusPublished - Mar 2014
Externally publishedYes

ASJC Scopus Subject Areas

  • General Chemistry
  • Surfaces and Interfaces
  • Process Chemistry and Technology

Keywords

  • APCVD
  • Photocatalyst
  • Thermal annealing
  • Ti vacancies

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