Effects of thermal, moisture and mechanical loading conditions on interfacial fracture toughness using Brazil-nut specimens

Shane Loo*, Subodh Mhaisalkar, Xueren Zhang, Hun Shen Ng, Tong Yan Tee

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Interfacial delamination is a common failure mode in multi-layered IC packages. In this paper, an experimental technique using Brazil-nut specimens is employed to determine the interfacial fracture toughness of an adhesively sandwiched joint with introduction of edge interfacial crack. The interface studied here is the die attach material/copper leadframe interface. Tensile loads are applied to the specimens at various loading angles until the failure of the samples. Design of experiments (DOE) is applied to study variations in strain rates and thickness of the sandwich structure. In addition, the effects of moisture content and temperature on the interfacial adhesion are investigated. For the DOEs conducted, as the loading angle increases from 20° to 90°, the interfacial fracture toughness decreases. It is found that moisture absorption and increase of temperature will have detrimental effects on the die attach material and likewise results in a corresponding decrease in fracture toughness. Failure patterns of the delaminated surfaces were observed with the scanning electron microscope (SEM) to determine the cohesive/adhesive modes of failure. The fracture toughness and its corresponding mode mixity are determined from the measured critical load by finite element modeling computation.

Original languageEnglish
Title of host publicationProceedings of 7th Electronics Packaging Technology Conference, EPTC 2005
Pages618-624
Number of pages7
Publication statusPublished - 2005
Externally publishedYes
Event7th Electronics Packaging Technology Conference, EPTC 2005 - Singapore, Singapore
Duration: Dec 7 2005Dec 9 2005

Publication series

NameProceedings of 7th Electronics Packaging Technology Conference, EPTC 2005
Volume2

Conference

Conference7th Electronics Packaging Technology Conference, EPTC 2005
Country/TerritorySingapore
CitySingapore
Period12/7/0512/9/05

ASJC Scopus Subject Areas

  • General Engineering

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