Electrical and thermal models of CNT TSV and graphite interface

Boris Vaisband*, Ange Maurice, Chong Wei Tan, Beng Kang Tay, Eby G. Friedman

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

11 Citations (Scopus)

Abstract

Carbon nanotubes (CNTs) are a suitable replacement for metals commonly used as a fill material for through substrate vias (TSVs). The electrical and thermal contact resistance, however, between the CNT TSVs and the horizontal metal interconnects (typically copper) can limit the use of CNT technology. A replacement for the horizontal metal interconnects in the form of graphite material is proposed in this paper. Electrical and thermal models of the interface between CNT TSVs and graphite interconnect are compared to the interface between CNT TSVs and copper interconnect. The proposed models include electrical and thermal crowding effects as well as the skin effect. The CNT/graphite interface exhibits up to 72.6% and 71.9%, respectively, lower electrical and thermal resistance as compared to the CNT/copper interface.

Original languageEnglish
Pages (from-to)1880-1886
Number of pages7
JournalIEEE Transactions on Electron Devices
Volume65
Issue number5
DOIs
Publication statusPublished - May 2018
Externally publishedYes

Bibliographical note

Publisher Copyright:
© 1963-2012 IEEE.

ASJC Scopus Subject Areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

Keywords

  • 3-D IC
  • Carbon nanotubes (CNTs)
  • Electrical model
  • Graphite
  • Thermal model
  • Through substrate via (TSV)

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