Electron field emission from surface treated tetrahedraL amorphous carbon films

X. Shi; L. K. Cheah; B. K. Tay; S. R.P. Silva

doi:10.1063/1.123383

Electron field emission from surface treated tetrahedraL amorphous carbon films

X. Shi^*, L. K. Cheah, B. K. Tay, S. R.P. Silva

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

31 Citations (Scopus)

Abstract

The electron field emission properties of tetrahedral amorphous carbon thin films deposited using a filtered cathodic vacuum arc system have improved as a result of surface treatment with H, O, and Ar ions. The limiting factor of the emission process does not appear to be only the front surface of the films. The improvement in the emission after ion beam treatment appears to be independent of the ions used. The surface which has been analyzed using ultraviolet photospectroscopy, reflected electron energy loss spectroscopy, and scanning tunneling microscopy shows evidence of the creation of segregated sp² and sp³ rich regions of less than 20 nm in dimension. An extension to the space charge-induced band bending model including a multistep emission process that occurs in this mixed phase material is proposed.

Original language	English
Pages (from-to)	833-835
Number of pages	3
Journal	Applied Physics Letters
Volume	74
Issue number	6
DOIs	https://doi.org/10.1063/1.123383
Publication status	Published - Feb 8 1999
Externally published	Yes

ASJC Scopus Subject Areas

Physics and Astronomy (miscellaneous)

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title = "Electron field emission from surface treated tetrahedraL amorphous carbon films",

abstract = "The electron field emission properties of tetrahedral amorphous carbon thin films deposited using a filtered cathodic vacuum arc system have improved as a result of surface treatment with H, O, and Ar ions. The limiting factor of the emission process does not appear to be only the front surface of the films. The improvement in the emission after ion beam treatment appears to be independent of the ions used. The surface which has been analyzed using ultraviolet photospectroscopy, reflected electron energy loss spectroscopy, and scanning tunneling microscopy shows evidence of the creation of segregated sp2 and sp3 rich regions of less than 20 nm in dimension. An extension to the space charge-induced band bending model including a multistep emission process that occurs in this mixed phase material is proposed.",

author = "X. Shi and Cheah, {L. K.} and Tay, {B. K.} and Silva, {S. R.P.}",

year = "1999",

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T1 - Electron field emission from surface treated tetrahedraL amorphous carbon films

AU - Shi, X.

AU - Cheah, L. K.

AU - Tay, B. K.

AU - Silva, S. R.P.

PY - 1999/2/8

Y1 - 1999/2/8

N2 - The electron field emission properties of tetrahedral amorphous carbon thin films deposited using a filtered cathodic vacuum arc system have improved as a result of surface treatment with H, O, and Ar ions. The limiting factor of the emission process does not appear to be only the front surface of the films. The improvement in the emission after ion beam treatment appears to be independent of the ions used. The surface which has been analyzed using ultraviolet photospectroscopy, reflected electron energy loss spectroscopy, and scanning tunneling microscopy shows evidence of the creation of segregated sp2 and sp3 rich regions of less than 20 nm in dimension. An extension to the space charge-induced band bending model including a multistep emission process that occurs in this mixed phase material is proposed.

AB - The electron field emission properties of tetrahedral amorphous carbon thin films deposited using a filtered cathodic vacuum arc system have improved as a result of surface treatment with H, O, and Ar ions. The limiting factor of the emission process does not appear to be only the front surface of the films. The improvement in the emission after ion beam treatment appears to be independent of the ions used. The surface which has been analyzed using ultraviolet photospectroscopy, reflected electron energy loss spectroscopy, and scanning tunneling microscopy shows evidence of the creation of segregated sp2 and sp3 rich regions of less than 20 nm in dimension. An extension to the space charge-induced band bending model including a multistep emission process that occurs in this mixed phase material is proposed.

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JF - Applied Physics Letters

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Electron field emission from surface treated tetrahedraL amorphous carbon films

Abstract

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