Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU

Samuel Chef; Chua Chung Tah; Jing Yun Tay; Jason Cheah; Chee Lip Gan

doi:10.1109/FDTC57191.2022.00010

Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU

Samuel Chef, Chua Chung Tah, Jing Yun Tay, Jason Cheah, Chee Lip Gan

Nanyang Technological University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

2 Citations (Scopus)

Abstract

Embedded Non-Volatile-Memory (NVM) such as Flash or EEPROM is a key component in modern microcontroller units. For instance, it can be used to store critical information such as user passwords or device firmware. Although several studies reported ways to extract binary data from embedded EEPROM bitcells, data organization has received less attention. In this paper, we present a method to identify bitcells organization in the EEPROM array. It relies on a combination of various laser-based techniques. The method was applied to an 8 bits AVR microcontroller.

Original language	English
Title of host publication	Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1-8
Number of pages	8
ISBN (Electronic)	9781665454421
DOIs	https://doi.org/10.1109/FDTC57191.2022.00010
Publication status	Published - 2022
Externally published	Yes
Event	19th Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022 - Virtual, Online, Italy Duration: Sept 16 2022 → …

Publication series

Name	Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022

Conference

Conference	19th Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022
Country/Territory	Italy
City	Virtual, Online
Period	9/16/22 → …

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

ASJC Scopus Subject Areas

Computer Networks and Communications
Information Systems
Safety, Risk, Reliability and Quality

Keywords

Embedded Non-Volatile-Memory
Laser Fault Injection
Laser Probing
SemiInvasive Analysis

Access to Document

10.1109/FDTC57191.2022.00010

Cite this

Chef, S., Tah, C. C., Yun Tay, J., Cheah, J., & Gan, C. L. (2022). Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU. In Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022 (pp. 1-8). (Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/FDTC57191.2022.00010

Chef, Samuel ; Tah, Chua Chung ; Yun Tay, Jing et al. / Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU. Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022. Institute of Electrical and Electronics Engineers Inc., 2022. pp. 1-8 (Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022).

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abstract = "Embedded Non-Volatile-Memory (NVM) such as Flash or EEPROM is a key component in modern microcontroller units. For instance, it can be used to store critical information such as user passwords or device firmware. Although several studies reported ways to extract binary data from embedded EEPROM bitcells, data organization has received less attention. In this paper, we present a method to identify bitcells organization in the EEPROM array. It relies on a combination of various laser-based techniques. The method was applied to an 8 bits AVR microcontroller.",

keywords = "Embedded Non-Volatile-Memory, Laser Fault Injection, Laser Probing, SemiInvasive Analysis",

author = "Samuel Chef and Tah, {Chua Chung} and {Yun Tay}, Jing and Jason Cheah and Gan, {Chee Lip}",

note = "Publisher Copyright: {\textcopyright} 2022 IEEE.; 19th Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022 ; Conference date: 16-09-2022",

year = "2022",

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Chef, S, Tah, CC, Yun Tay, J, Cheah, J & Gan, CL 2022, Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU. in Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022. Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022, Institute of Electrical and Electronics Engineers Inc., pp. 1-8, 19th Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022, Virtual, Online, Italy, 9/16/22. https://doi.org/10.1109/FDTC57191.2022.00010

Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU. / Chef, Samuel; Tah, Chua Chung; Yun Tay, Jing et al.
Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022. Institute of Electrical and Electronics Engineers Inc., 2022. p. 1-8 (Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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AB - Embedded Non-Volatile-Memory (NVM) such as Flash or EEPROM is a key component in modern microcontroller units. For instance, it can be used to store critical information such as user passwords or device firmware. Although several studies reported ways to extract binary data from embedded EEPROM bitcells, data organization has received less attention. In this paper, we present a method to identify bitcells organization in the EEPROM array. It relies on a combination of various laser-based techniques. The method was applied to an 8 bits AVR microcontroller.

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KW - SemiInvasive Analysis

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Chef S, Tah CC, Yun Tay J, Cheah J, Gan CL. Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU. In Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022. Institute of Electrical and Electronics Engineers Inc. 2022. p. 1-8. (Proceedings - 2022 Workshop on Fault Detection and Tolerance in Cryptography, FDTC 2022). doi: 10.1109/FDTC57191.2022.00010

Embedded-EEPROM descrambling via laser-based techniques - A case study on AVR MCU

Abstract

Publication series

Conference

Bibliographical note

ASJC Scopus Subject Areas

Keywords

Access to Document

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