Enhanced Student-graph Representation for At-risk Student Detection

Wei Qiu*, Andy W.H. Khong, Fun Siong Lim

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Predicting examination grades is essential to facilitate early interventions and to enhance student retention rates in an academic institution. We propose a predictive model based solely on historical academic performance made available before the beginning of each semester. The proposed model employs singular value decomposition to distill the underlying student-course graph structure, resulting in a student representation vector that holistically captures a student's academic ability across courses in relation to their cohort. This representation vector is then fused with the student's historical academic records for grade prediction. Data for training the proposed prediction model was sourced from approximately five thousand Electrical and Electronic Engineering students across seventeen core courses, including Circuit Analysis and Analog Electronics taught in the sophomore year. Students identified as at risk of failing a course at the beginning of each semester may be offered targeted (academic) support such as peer tutoring programs.

Original languageEnglish
Title of host publicationISCAS 2024 - IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)9798350330991
DOIs
Publication statusPublished - 2024
Externally publishedYes
Event2024 IEEE International Symposium on Circuits and Systems, ISCAS 2024 - Singapore, Singapore
Duration: May 19 2024May 22 2024

Publication series

NameProceedings - IEEE International Symposium on Circuits and Systems
ISSN (Print)0271-4310

Conference

Conference2024 IEEE International Symposium on Circuits and Systems, ISCAS 2024
Country/TerritorySingapore
CitySingapore
Period5/19/245/22/24

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

ASJC Scopus Subject Areas

  • Electrical and Electronic Engineering

Keywords

  • at-risk detection
  • early intervention
  • Grade prediction
  • singular value decomposition

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