Erratum: Raman spectroscopy and x-ray diffraction studies of (Ti,Al)N films deposited by filtered cathodic vacuum arc at room temperature (Journal of Applied Physics (2001) 89 (6192))

Y. H. Cheng*, B. K. Tay, S. P. Lau, X. Shi

*Corresponding author for this work

Research output: Contribution to journalComment/debatepeer-review

Original languageEnglish
Pages (from-to)10231
Number of pages1
JournalJournal of Applied Physics
Volume91
Issue number12
DOIs
Publication statusPublished - Jun 15 2002
Externally publishedYes

ASJC Scopus Subject Areas

  • General Physics and Astronomy

Cite this