Fabrication at wafer level of micromachined gas sensors based on Sno 2 nanorods deposited by PECVD and gas sensing characteristics

A. Forleo*, L. Francioso, S. Capone, F. Casino, P. Siciliano, H. Huang, O. K. Tan

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

SnO2 nanorods were successfully deposited on 3 Si/SiO 2 wafers by inductively coupled plasma-enhanced chemical vapor deposition (PECVD) and a wafer-level patterning of nanorods layer for miniaturized solid state gas sensor fabrication were performed. Uniform needle-shape SnO2 nanorods in situ grown were obtained under catalyst- and high temperature treatment-free growth condition. These nanorods have an average diameter between 5 and 15 nm and a length of 160 to 300 nm. The SnO2-nanords based gas sensors were tested towards NH3 and CH3OH and gas sensing tests show remarkable response, showing promising and repeatable results compared with the SnO2 thin films gas sensors.

Original languageEnglish
Title of host publicationProceedings of the 4th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2011
Pages196-198
Number of pages3
DOIs
Publication statusPublished - 2011
Externally publishedYes
Event4th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2011 - Savelletri di Fasano, Brindisi, Italy
Duration: Jun 28 2011Jun 29 2011

Publication series

NameProceedings of the 4th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2011

Conference

Conference4th IEEE International Workshop on Advances in Sensors and Interfaces, IWASI 2011
Country/TerritoryItaly
CitySavelletri di Fasano, Brindisi
Period6/28/116/29/11

ASJC Scopus Subject Areas

  • Computer Networks and Communications
  • Human-Computer Interaction

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