Failure analysis of damages on advanced technologies induced by picosecond pulsed laser during space radiation see testing

Keyphrases

• Inverter Chain 100%
• Picosecond Laser 100%
• Signal Waveform 50%
• Electro Optical Frequency Mapping 50%
• Safe Operating Space 50%
• Space Optical 50%
• Single Event Effects 50%
• Beam Transmission 50%
• Electro Optical Probing 50%
• Effect Evaluation 50%
• Permanent Damage 50%
• Transmission Microscopy 50%
• Emission Microscopy 50%
• Technology Node 50%
• Bulk CMOS 50%
• Particle Accelerators 50%
• Laser Testing 50%

Medicine and Dentistry

• Energy-Dispersive Spectroscopy 100%
• Energy Dispersive X-Ray Spectroscopy 100%
• Heavy Ion 100%

Engineering

• Signal Waveform 25%
• Single Event Effect 25%
• Optical Frequency 25%
• Output Signal 25%
• Test Technique 25%
• Induced Damage 25%