Ferroelectric tunnel junction memory devices made from monolayers of vinylidene fluoride oligomers

Damar Yoga Kusuma, Pooi See Lee*

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

42 Citations (Scopus)

Abstract

Conductance bistability in Pt/Si-vinylidene fluoride (VDF) oligomer-Au ferroelectric tunnel junction devices is demonstrated. I-V and C-V measurements reveal bistable conductance switching within biasing voltage of ±0.5V with stable memory retention up to 1 × 104 cycles. The memory element exhibits a low switching voltage of ±1.0 V, coincides with the coercive field of the ferroelectric VDF oligomer monolayer films in use.

Original languageEnglish
Pages (from-to)4163-4169
Number of pages7
JournalAdvanced Materials
Volume24
Issue number30
DOIs
Publication statusPublished - Aug 8 2012
Externally publishedYes

ASJC Scopus Subject Areas

  • General Materials Science
  • Mechanics of Materials
  • Mechanical Engineering

Keywords

  • memory device
  • monolayer film
  • organic ferroelectric
  • resistive switching
  • VDF oligomer

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